Abstract
This editorial introduces the first part of CEJEME's Special Issue on Artificial Intelligence and Machine Learning in Educational Measurement. As AI and ML technologies revolutionize education, they offer new opportunities for personalized learning and innovative assessment practices. This issue highlights the transformative impact of AI and ML on educational measurement, addressing both their potential and the ethical challenges they pose. This issue includes four articles that explore the opportunities and ethical challenges of AI in educational measurement, automated text scoring in the age of Generative AI for the GPU-poor, a novel approach using autoencoders and BERT to detect compromised items in computerized testing, and the use of ML packages in R. The issue provides valuable insights into the future of educational measurement. A second part of this special issue will be available in spring 2025.
Recommended Citation
Bulut, Okan and Zheng, Yi
(2024)
"Editorial: Special Issue on Artificial Intelligence and Machine Learning in Educational Measurement (Part 1),"
Chinese/English Journal of Educational Measurement and Evaluation | 教育测量与评估双语期刊: Vol. 5:
Iss.
3, Article 1.
DOI: https://doi.org/10.59863/BDQT2557
Available at:
https://www.ce-jeme.org/journal/vol5/iss3/1
DOI
https://doi.org/10.59863/BDQT2557