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Special Issue on Artificial Intelligence and Machine Learning in Educational Measurement (Part 1)

Introduction

This issue is the first part of CEJEME's Special Issue on Artificial Intelligence and Machine Learning in Educational Measurement. As AI and ML technologies revolutionize education, they offer new opportunities for personalized learning and innovative assessment practices. This issue highlights the transformative impact of AI and ML on educational measurement, addressing both their potential and the ethical challenges they pose. The issue includes four articles that explore the opportunities and ethical challenges of AI in educational measurement, automated text scoring in the age of Generative AI for the GPU-poor, a novel approach using autoencoders and BERT to detect compromised items in computerized testing, and the use of ML packages in R. These articles provide valuable insights into the future of educational measurement. The second part of this special issue will be available in spring 2025. (注：中文版本将稍后上线。感谢您的耐心等待!）-- Yi Zheng and Okan Bulut, co-editors of the special issue.